SESSION MP 2
SALON 1-6, Mon., 7
1:30 PM



NYQUIST-RATE DATA CONVERTERS

Chair: K. Poulton, Agilent Technologies, Palo Alto, CA
Associate Chair: K. Martin, Univ. of Toronto, Toronto, Ontario, Canada

2.1 A 14b 100MSample/s 3-Stage A/D Converter
1:30 PM
C. Moreland, M. Elliott, F. Murden, J. Young, M. Hensley, R. Stop
Analog Devices, Inc., Greensboro, NC

A 14b ADC uses a three-stage subranging architecture. Each conversion stage consists of a string of serially-connected folding amplifiers which produce low bit-error-rate gray-coded output data. A prototype converter in a 0.8 um double-poly complementary bipolar process achieves a 100MSample/s conversion rate with 1.25W dissipation.


2.2 A 13b 40MSample/s CMOS Pipelined Folding ADC with Background Offset Trimming
2:00 PM
M-J. Choe, B.-S. Song 1, K. Bacrania 2
Univ. of Illinois, Urbana, IL
1Univ. of California, San Diego, CA
2Intersil Semiconductor, Melbourne, FL

Pipelining and background offset trimming enhances performance of a CMOS folding/interpolating ADC to a 13b level. The prototype, further refined using subranging and digital correction, has 82dB SFDR. The chip occupies 8.7mm 2 in 0.5 um CMOS and consumes 800mW at 5V.


2.3 A 12b 65MSample/s CMOS ADC with 81dB SFDR at 120MHz
2:30 PM
L. Singer, S. Ho, M. Timko, D. Kelly
Analog Devices, Inc., Wilmington, MA

A pipeline ADC using digital calibration and bootstrapped input switches achieves 81dB SFDR for a 120MHz analog input. With a 2.5MHz analog input, SNR is 70dB and SFDR is 85dB. The 10mm 2 ADC is realized in 0.5 um double-poly CMOS and dissipates 515mW from a 5V analog / 3V digital supply.

BREAK 3:00 PM


2.4 A 3.3V 12b 50MSample/s A/D Converter in 0.6 um CMOS with 80dB SFDR
3:15 PM
H. Pan, M. Segami, M. Choi, J. Cao, F. Hatori, A. Abidi
Univ. of California, Los Angeles, CA

A 6b-7b two-stage pipelined ADC uses bootstrapping to linearize the sampling switch of on-chip track-hold to achieve over 80dB SFDR for signal frequencies up to 75MHz without trimming, calibration, or dithering. INL is 1.3LSB, DNL is 0.8LSB. In 0.6 um CMOS, the active area is 16mm 2 and the ADC dissipates 850mW from 3.3V supply.


2.5 An 8b 80MSample/s Pipelined ADC with Background Calibration
3:45 PM
J. Ming, S. Lewis
Univ. of California, Davis, CA

A pipelined ADC uses adaptive background calibration to minimize the effects of interstage gain errors. It achieves 0.33 LSB DNL, 0.49 LSB INL, and 46dB peak SNDR. It dissipates 250mW from 3V and occupies 10.3mm 2 in single-poly 0.5 um CMOS.


2.6 A Self-Trimming 14b 100MSample/s CMOS DAC
4:15 PM
A. Bugeja, B-S. Song 1
Texas Instruments, Dallas TX
1University of California, San Diego, CA

A CMOS DAC uses self-trimming to achieve 14b INL/DNL and a track/attenuate output sampler to reach 72dB SFDR at 42MHz output frequency. The chip occupies 11mm 2 in 0.35 um CMOS and consumes 180mW at 3V at 100MSample/s.

2.7 A 14b 20MSample/s CMOS Pipelined ADC
4:45 PM
H-S. Chen, K. Bacrania, B-S. Song 1
Intersil Semiconductor, Melbourne FL
1University of California, San Diego, CA

A pipelined ADC uses capacitor-error averaging, look-ahead decision-making and digital correction to achieve 14b DNL, 13b INL and 87.6dB SFDR at 20MSamples/s with no trim or calibration. A prototype in 0.5 um CMOS is 4.5x2.4mm 2 and consumes 720mW at 5V.

CONCLUSION 5:00 PM