Discussion Session


TE 5 - In-House CAD versus Vendor CAD

for High-Performance Processors
(Sunset A - C)
Organizer: Ted Williams, HaL Computer Systems, Campbell, CA
Moderator: Patrick Bosshart, Texas Instruments, Dallas, TX

Designing high-performance VLSI chips stresses to the limit CAD tools for simulation, circuit design, timing verification, placement/routing, and physical verification. The extreme demands of aggressive designs require quick response times in tool development and support. But do vendor CAD companies care enough about this tiny market segment to supply adequate tools and support for custom design? Can in-house CAD teams really acquire the necessary expertise and manpower? Should design teams pick the best point-tools for each function or is an integrated "framework" more essential?

Panel: Anant Agrawal, Sun Microsystems, Mountain View, CA
Gil Amid, Intel Design Center, Haifa, Israel
William Grundmann, Digital Equipment Corp., Hudson, MA
Wally Rhines, Mentor Graphics Corp., Wilsonville, OR
Matthew Rohm, Silicon Graphics Inc., Mountain View, CA
James Solomon, Cadence Design Systems, San Jose, CA


TE 6 - Single-Chip Integration versus Multichip Modules

(Sunset D - F)
Moderator: Stephen Flannagan, Motorola, Austin, TX

Advances in VLSI integration capability now permit many different functions combined on a single chip. High-performance CPU, interface circuits, and high-density SRAM may all be combined. However, challenges in this activity _include yield, embedded-testability and cost. Equally dramatic advancements have been made in multichip-module technology. The ability to combine several types of pre-tested die in a single module has also been recognized. The optimum approach for system partitioning is open to wide discussion, since it is influenced by so many diverse technical factors. Discussion on this topic includes world-recognized experts in both fields of high-integration and of multichip packaging.

Panel: Evan Davidson, IBM, Poughkeepsie, NY
Paul Franzon, North Carolina State Univ., Raleigh, NC
Kasuro Sasaki, Hitachi America, San Jose, CA
Frank Swiatowiec, Micromodule Systems, Cupertino, CA
Masahide Takada, NEC Microelectronics, Kanagawa, Japan


TE7 - Radio Front-End and Digital Signal Processing:

Incompatible Technologies or Incompatible People?
(Marina A - C)
Moderator/Organizer: Matt Rhodes, PCSI, San Diego

In the ultimate personal communication device, integration will be of paramount importance. However, integration requires transistors performing at radio frequencies on the same substrate as circuits performing digital signal-processing functions. Is this practical or are the technology requirements too different or too costly? Or are the cultures and practices of RF and digital designers so different that the enabling design strategy has yet to be identified?

Panel: Asad A. Abidi, University of California, Los Angeles, CA
Peter Baltus, Philips Research Labs, Eindhoven, The Netherlands
Ricke Clark, Rockwell International, Newport Beach, CA
Joseph Fenk, Siemens AG, Munich, Germany
Gene Frantz, Texas Instruments, Dallas, TX
Masayuki Ishikawa, NTT LSI Labs, Atsugi, Japan
Mehmet Soyuer, IBM T.J. Watson Research Ctr.


TE 8 - Monolithic Surface-Micromachined Sensors:

IC Technology of the Next Century?
(Marina D - F)
Moderator: Richard Payne, Analog Devices, Wilmington, MA
Organizer: Bernhard Boser, Dept. of EECS, Univ. of California, Berkeley, CA

Will surface-micromachined monolithic sensors become as pervasive as ICs? For this to happen, electronic sensing systems must become as pervasive as today's "pure" electronic systems, and surface-micromachined sensors must be the lowest-cost solution. "Pure" electronic systems already interact with the real-world to exchange information, but silicon plays a minor role in this interaction. Can it play a bigger role? Can sensors realized in silicon achieve the required performance and be integrated at low cost? The audience and panel will explore the state of the art and speculate on the future art.

Panel: Bedrich Hosticka, Fraunhofer Institute, Duisburg, Germany
Roger Howe, Dept. of EECS, Univ. of California, Berkeley, CA
Lj Ristic, Motorola Inc., Mesa, AZ
Felix Rudolf, CSEM, Neuchâtel, Switzerland
Martin Schmidt, Dept. of EECS, MIT, Cambridge, MA
Kenichiro Suzuki, NEC Corp., Tsukuba, Japan
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